Three-in-One Optical Testing for OLED Devices: IVL + Lifetime + External Quantum Efficiency
To meet the needs of scientific research testing, Fstar provides an all-in-one testing machine integrating I-V-L testing, viewing angle testing, lifetime testing, luminous flux testing, and external quantum efficiency testing functions. A high-precision multi-channel power supply is added to provide constant current or constant voltage output for multi-station lifetime testing, while the luminance of devices is obtained by scanning each station one by one with a spectrometer. To accurately measure the external quantum efficiency of devices, an integrating sphere for luminous flux testing and a fiber optic spectrometer are added; devices are placed inside the integrating sphere to measure luminous flux and external quantum efficiency. A built-in calibrated A light source can improve the accuracy of luminous flux testing.

Settings for I-V-L Curve Measurement

1. The starting voltage, ending voltage, and voltage step can be set for continuous measurement.

2. The starting current density, ending current density, and current density step can be set for continuous measurement.

3. A separate lower limit for luminance detection based on current density can be set: when below the lower limit, only current and voltage are measured; when exceeding the lower limit, voltage, current, luminance, and other data are measured simultaneously.

4. The set machine model parameters can be saved and directly recalled for the next measurement.

I-V-L Measurement Data

Measurement results include: luminance L (cd/m²), current efficiency (mA/cm²), luminous efficiency, external quantum efficiency (EQE), chromaticity coordinates (x, y), color temperature, color rendering index (CRI), and luminous spectrum.

Charts included in the output measurement report: Cdens-V, Cdens-L, Cdens-LumE, Cdens-EQE, CIE1931, and Spectra.