Silicon Photoelectric Lifetime Measurement System FS-MP-H Teries for OLED Devices Under High-Temperature Environments

The high-temperature testing system is divided into chamber temperature control and base plate heating temperature control.

• Chamber heating temperature range: Room temperature to -40℃~100℃;
• Base plate heating temperature: Room temperature to 100℃.

Software Functions

(1) Measurement Modes: Constant voltage, constant current, square wave voltage, square wave current

(2) All channels of the software can be independently configured with current and voltage test conditions without mutual interference.

• -Each light-emitting point can independently set parameters such as voltage or current, and start/stop measurement independently. It supports users to add or replace several products during the test.
• -Measurement time control: Equipped with 3 time segment designs; each channel can separately set parameters such as measurement time and interval for each time segment.
• -Pre-measurement preprocessing function: Features 4 preprocessing segments. Each preprocessing segment can set parameters including temperature, current, voltage, and time. Before normal measurement, aging is performed under preprocessing conditions first, and then the system enters the normal lifetime test procedure.

(3) All channels of the software allow real-time checking of detailed measurement data and charts.

• -Data includes sample information, measurement time, elapsed measurement duration, photosensitive current, remaining luminance ratio, voltage, current, estimated lifetime, temperature, humidity, luminance, etc.
• -Multi-channel graphs: Supports selecting data such as voltage, current, luminance decay, and lifetime duration of multiple channels, and displays curves in a single chart for easy comparison and screening.
• -Data is stored in real-time; after recovery from abnormalities, data can be retrieved and testing can continue (interrupted time is not accumulated and can be automatically subtracted).
• -Data is processed and recorded in real-time, with automatic generation of data charts and test reports; Datalog and Eventlog are recorded in real-time.

Software Interface